New York, Feb. 11, 2020 (GLOBE NEWSWIRE) -- Reportlinker.com announces the release of the report "Global E-Beam Wafer Inspection System Industry" - https://www ...

Optical inspection cannot resolve critical defects at advanced nodes and cannot detect subsurface defects. Especially at 7nm and below, many yield and reliability killer defects are the result of ...

SANTA CLARA, Calif., Dec. 14, 2022 (GLOBE NEWSWIRE) -- Applied Materials, Inc. today announced the commercial availability of “cold field emission” (CFE) technology, a breakthough in eBeam imaging ...

Revenues at Hermes Microvision (HMI), which provides electron beam (e-beam) inspection tools and solutions for the production of semiconductors, are set to hit a record high for the... E-beam ...

Metrology giant KLA-Tencor says that electron beam inspection is ready for volume production line monitoring, not just development and ramp. Shrinking features and higher aspect ratios coupled with ...

Electron beam (e-beam) inspection tool and solution provider Hermes Microvision (HMI) has announced November revenues of NT$432 million (US$13.2 million), representing a 101% jump... Electron beam ...

Applied’s new “cold field emission” technology works at room temperature, increasing nanoscale image resolution by up to 50% and imaging speed by up to 10X CFE eBeam technology enables leading ...