The foundation of parametric test within semiconductor manufacturing is its usefulness in determining that wafers have been fabricated properly. Foundries use parametric test results to help verify ...
Investopedia contributors come from a range of backgrounds, and over 25 years there have been thousands of expert writers and editors who have contributed. Gordon Scott has been an active investor and ...
Taking a swipe at the cost of ownership, two additions to the Pyramid parametric probe card family allow single-pass DC and RF measurements, promising to reduce the cost of parametric production test ...
A K-sample testing problem is studied for multivariate counting processes with time-dependent frailty. Asymptotic distributions and efficiency of a class of non-parametric test statistics are ...
In this article, we revisit some problems in non-parametric hypothesis testing. First, we extend the classical result of Bahadur & Savage [Ann. Math. Statist. 25 (1956) 1115] to other testing problems ...
Background Chronic ankle instability (CAI) is associated with changes in gait biomechanics, which may be related to chronic dysfunction. Multivariate analysis of the lower extremity during gait may ...
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