A technical paper titled “Cost-Optimized and Robust Latch Hardened against Quadruple Node Upsets for Nanoscale CMOS” was just published by researchers at Anhui University, Hefei University of ...
This white paper reviews how the increase in the number of power domains and voltages used in today's IC design has increased the importance of identifying and eliminating areas of susceptibility to ...
For a place we think of as the ultimate void, space is populated with many high-energy particles that can damage semiconductor devices. There are electrons and ...
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